Publications

Palmerina González-Izquierdo, Névine Rochat, Matthew Charles, Tomasz Sochacki, Łukasz Borowik, Kelvin Probe Force Microscopy under variable illumination: a novel technique to unveil charge carrier dynamics in GaN, The Journal of Physical Chemistry C, Vol 127, Issue 26, (2023), DOI:10.1021/acs.jpcc.3c01887

Elena Ermilova, Matthias Weise and Andreas Hertwig, Application of imaging ellipsometry and white light interference microscopy for detection of defects in epitaxially grown 4H-SiC layers, J. Eur. Opt. Society-Rapid Publ. (2023), 19, 23, DOI: 10.1051/jeos/2023018

Aidas Baltušis, George Koutsourakis, Sebastian Wood and Stephen J Sweeney, Development of Time-Resolved Photoluminescence Microscopy of Semiconductor Materials and Devices using a Compressed Sensing Approach, Meas. Sci. Technol. 35 (2024) 015207, DOI: 10.1088/1361-6501/ad044f

Jila Rafighdoost, Dmytro Kolenov, Silvania F. Pereira, Coherent Fourier scatterometry for detection of killer defects on silicon carbide samples, IEEE Transactions on Semiconductor Manufacturing 37 (2024) 124, DOI: 10.1109/TSM.2023.3337720

Selma Metzner, Bernd Kästner, Manuel Marschall, Gerd Wübbeler, Stefan Wundrack, Andrey Bakin, Arne Hoehl, Eckart Rühl, Clemens Elster, Assessment of Subsampling Schemes for Compressive Nano-FTIR Imaging, IEEE Transactions on Instrumentation and Measurement, vol. 71, pp. 1-8, (2022), 4506208, DOI: 10.1109/TIM.2022.3204072

Konrad Sakowski, Łukasz Borowik, Névine Rochat, Pawel Kempisty, Pawel Strak, Natalia Majewska, Sebastian Mahlik, Kamil Koroński, Tomasz Sochacki, Jacek Piechota, Marc Fouchier, Agata Kaminska, Stanislaw Krukowski, On method of estimating recombination rates by analysis of time-resolved luminescence, Journal of Luminescence, 269, (2024), 120473, DOI: 10.1016/j.jlumin.2024.120473.

Jana Grundmann, Bernd Bodermann, Elena Ermilova, Matthias Weise, Andreas Hertwig, Petr Klapetek, Jila Rafighdoost, and Silvania F. Pereira, Optical and tactile measurements on SiC sample defects, Journal of Sensors and Sensor Systems 13 (2024) 109, DOI: 10.5194/jsss-13-109-2024

S Soman, R C Horsten, T Scholte and S F Pereira, Multi-beam coherent Fourier scatterometry, Meas. Sci. Technol. 35 (2024) 075905, DOI: 10.1088/1361-6501/ad3b2a